Process Engineer III, Secondary Ion Mass Spectrometry (SIMS) Metrology

What you'll do

• Characterize dopant profiles to demonstrate implanter performance and diffusion depths across various recipes.
• Manage SIMS lab activities to balance output and cycle time against customer requirements.
• Develop and refine standard operating procedures for tool operation, qualification, and performance tracking.
• Drive the development of advanced SIMS characterization techniques for emerging device architectures.
• Perform experimental design (DOE), root-cause analysis, and process problem-solving with engineering teams.
• Establish statistical process control and monitor tool health to ensure high uptime and product yield.
• Provide technical consultation, training, and analytical support to internal and external customers.
• Prepare technical presentations and publish findings in industry conferences and scientific forums.

What we're looking for

• Must possess an advanced degree (MS or PhD) in Materials Science, Physics, Chemical Engineering, Semiconductor Engineering, or a related field.
• Must have direct knowledge and proven interest in ion beam interaction with materials and defects.
• Requires hands-on experience operating and maintaining advanced metrology or analytical instrumentation.
• Experience in the semiconductor industry with SIMS, Vacuum Electronics, Atom Probe Tomography, or Mass Spectrometry is preferred.
• Strong understanding of semiconductor fundamentals including process modules, characterization, device physics, and fabrication.
• Fab experience or a failure-analysis background in ion doping and related metrology is preferred.
• Must be able to communicate complex information clearly and maintain composure during high-stakes conversations.
• Ability to provide informal guidance and mentorship to new team members and technicians.