Application Engineer V

What you'll do

• Develop metrology applications using optical thin film techniques to qualify semiconductor process tools.
• Provide data analysis and implement metrology best practices for product and process development projects.
• Lead internal and customer technical review meetings to address complex metrology solutions.
• Define customer technical requirements through deep analysis of the product roadmap.
• Design and perform complex engineering experiments to provide innovative technical solutions.
• Guide less experienced engineers in utilizing metrology techniques to define methods for complex systems.
• Engage with key vendors to understand latest techniques and influence future solution roadmaps.
• Conceive and implement new technologies to serve as a primary inventor on critical patents.

What we're looking for

• MS equivalent or higher in engineering or science.
• At least 5 years of relevant work experience.
• General expertise in on-wafer metrology with specific expertise in optical thin film or X-ray based metrology.
• Several years of experience working on metrology applications using optical film metrology techniques in the semiconductor industry.
• Expertise in optical thin film metrology techniques such as Ellipsometry, Scatterometry, and Reflectometry (preferred).
• Proven track record of significant technology contributions and experience as a primary inventor on numerous critical patents.
• Ability to lead and collaborate on the development of new principles, concepts, and exceptionally complex technology projects.
• Ability to communicate complex ideas and persuade others, often at senior levels.