Application Engineer V

What you'll do

• Develop metrology applications using optical thin film techniques like Ellipsometry, Scatterometry, and Reflectometry to qualify semiconductor tools.
• Provide technical leadership and data analysis for complex metrology projects to support product and process development.
• Engage with key vendors to evaluate new metrology techniques and influence future technology roadmaps.
• Define customer technical requirements through deep analysis of the product roadmap and system performance needs.
• Design and execute innovative engineering experiments while compiling reports on complex technical issues.
• Mentor and guide less experienced engineers in utilizing metrology techniques for complex systems.
• Lead internal and customer technical review meetings to present and resolve metrology solutions.

What we're looking for

• Must have an MS equivalent or higher degree in engineering or science.
• Must have at least 5 years of relevant work experience.
• Must be a general expert in on-wafer metrology with specific expertise in optical thin film and X-ray based metrology.
• Preferred expertise includes Ellipsometry, Scatterometry, and Reflectometry techniques.
• Must have several years of experience working on metrology applications in the semiconductor industry.
• Must possess a proven track record of significant technology contributions and technical expertise in their field.
• Must be able to lead complex engineering projects and research new technologies.
• Must be able to communicate complex ideas and persuade others at senior levels.