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Application Engineer IV

Applied Materials

Santa Clara,Ca, US 26 days ago $147,000$202,500
Optical_thin_film_metrology X-ray_based_metrology SIMS electrical_film_metrology optical_defect_inspection TXRF_VPD VPD_ICPMS nano_indentation profilometry_AFM photoacoustic_techniques data_analysis metrology_best_practices patent_invention technical_leadership problem_solving

Application Engineer IV

Applied Materials

Santa Clara,Ca, US 26 days ago $147,000$202,500
Optical thin film metrology scatterometry UV-visible techniques IR techniques XRF XPS HR-XRD SIMS electrical film metrology contact techniques non-contact techniques optical defect inspection unpatterned wafer inspection edge inspection TXRF-VPD VPD-ICPMS nano-indentation profilometry AFM photoacoustic techniques