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Overlay Metrology Engineer

IBM

Albany, NY 18 days ago
Actively hiring Verified listing
KLA Overlay mark design KERF development Image‑Based overlay targets SEM‑Based overlay targets Diffraction‑Based overlay targets Run‑to‑run control software Line control software 5DA Ovalis KT‑Analyzer Metrology Target Designer (MTD) Data analysis Technical presentations Microelectronics industry experience
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